S-2-E-4-G

INTERCONNECT DEVICES S-2-E-4-G 弹簧探头, PCB

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Convex Tip

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 4.0 Oz. @ 0.100 2.54 In.mm

e络盟:
# INTERCONNECT DEVICES S-2-E-4-G 弹簧探头, PCB

Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing 90 degree convex

Newark:
# INTERCONNECT DEVICES S-2-E-4-G SPRING CONTACT PROBE, PCB

S-2-E-4-G详细参数

S-2-E-4-G PDF数据文档

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