S-2-H-4-G

Spring Contact Probe .100 size 2 centerline spacing waffle

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Serrated

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 4.0 Oz. @ 0.100 2.54 In.mm

Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing waffle

S-2-H-4-G详细参数

S-2-H-4-G PDF数据文档

图片	型号	厂商	下载
	S-2-H-4-G	IDIInterconnect Devices
	S-2-H-10-G	IDIInterconnect Devices
	S-2-A-4-G	IDIInterconnect Devices
	S-2-A-7-G	IDIInterconnect Devices
	S-2-H-7-G	IDIInterconnect Devices
	S-2-B-4-G	IDIInterconnect Devices
	S-2-D-4-G	IDIInterconnect Devices
	S-2-E-4-G	IDIInterconnect Devices
	S-2-G-4-G	IDIInterconnect Devices
	S-2-B-8.3-G	IDIInterconnect Devices
	S-2-F-4-G	IDIInterconnect Devices