S-2-D-4-G

INTERCONNECT DEVICES S-2-D-4-G 弹簧探头, PCB

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Spherical Radius headed

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 4.0 Oz. @ 0.100 2.54 In.mm

e络盟:
弹簧探头, PCB

Allied Electronics:
Test Spring Probe 3A Gold 1.6oz Spring Force

Newark:
The S-2-D-4-G is a 24.64mm Spring Contact Probe with test-point connector. The S-series probe features gold-plated barrel, gold plated beryllium copper plunger, gold-plated beryllium copper spring.

S-2-D-4-G详细参数

S-2-D-4-G PDF数据文档

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	S-2-D-4-G	IDIInterconnect Devices
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	S-2-A-4-G	IDIInterconnect Devices
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	S-2-H-4-G	IDIInterconnect Devices
	S-2-H-7-G	IDIInterconnect Devices
	S-2-B-4-G	IDIInterconnect Devices
	S-2-E-4-G	IDIInterconnect Devices
	S-2-G-4-G	IDIInterconnect Devices
	S-2-B-8.3-G	IDIInterconnect Devices
	S-2-F-4-G	IDIInterconnect Devices