S-2-B-7-G

INTERCONNECT DEVICES S-2-B-7-G 弹簧探头, PCB, 30°尖头

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Spear Tip

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 7.0 Oz. @ 0.100 2.54 In.mm

e络盟:
# INTERCONNECT DEVICES S-2-B-7-G 弹簧探头, PCB, 30°尖头

Allied Electronics:
Spring Contact Probe .100 size 2 centerline spacing 30 degree spear

S-2-B-7-G详细参数

S-2-B-7-G PDF数据文档

图片	型号	厂商	下载
	S-2-B-7-G	IDIInterconnect Devices
	S-2-H-10-G	IDIInterconnect Devices
	S-2-A-4-G	IDIInterconnect Devices
	S-2-A-7-G	IDIInterconnect Devices
	S-2-H-4-G	IDIInterconnect Devices
	S-2-H-7-G	IDIInterconnect Devices
	S-2-B-4-G	IDIInterconnect Devices
	S-2-D-4-G	IDIInterconnect Devices
	S-2-E-4-G	IDIInterconnect Devices
	S-2-G-4-G	IDIInterconnect Devices
	S-2-B-8.3-G	IDIInterconnect Devices