SN74BCT8373ADWR

八进制D类锁存器扫描测试设备 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Scan Test Device with D-Type Latches IC 24-SOIC

得捷:
IC SCAN TEST DEVICE LATCH 24SOIC

贸泽:
Specialty Function Logic Device w/Octal D-Type Latches

Chip1Stop:
Latch Transparent 3-ST 8-CH D-Type 24-Pin SOIC T/R