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KAI-08051-ABA-JD-BA

KAI Series Monochrome Interline CCDBased on the TRUESENSE 5.5 micron Interline Transfer CCD Platform, these monochrome sensors feature broad dynamic range, excellent imaging performance and a flexible readout architecture.KAI-01150 1280 x 720p @ 138fps max RS 874-4060 KAI-01050 1024 x 1024p @ 120fps max RS 874-4064 KAI-02050 1600 x 1200p @ 68fps max RS 874-4073 KAI-02150 2004 x 1144p @ 64fps max RS 874-4076 KAI-04050 2336 x 1752p @ 32fps max RS 874-4070 KAI-08051 3356 x 2520p @ 32fps max RS 874-4089 ### 注意These devices contain limited protection against Electrostatic Discharge ESD. ESD events may cause irreparable damage to a CCD image sensor either immediately or well after the ESD event occurred. Failure to protect the sensor from electrostatic discharge may affect device performance and reliability. Devices should be handled in accordance with strict ESD procedures for Class 0 See Application Note:** Image Sensor Handling Best Practices** for proper handling and grounding procedures. This application note also contains workplace recommendations.### ON Semi Image Sensors

KAI Series Monochrome Interline CCD

Based on the TRUESENSE 5.5 micron Interline Transfer CCD Platform, these monochrome sensors feature broad dynamic range, excellent imaging performance and a flexible readout architecture.

KAI-01150 1280 x 720p @ 138fps max RS 874-4060

KAI-01050 1024 x 1024p @ 120fps max RS 874-4064

KAI-02050 1600 x 1200p @ 68fps max RS 874-4073

KAI-02150 2004 x 1144p @ 64fps max RS 874-4076

KAI-04050 2336 x 1752p @ 32fps max RS 874-4070

KAI-08051 3356 x 2520p @ 32fps max RS 874-4089

### 注意

These devices contain limited protection against Electrostatic Discharge ESD. ESD events may cause irreparable damage to a CCD image sensor either immediately or well after the ESD event occurred. Failure to protect the sensor from electrostatic discharge may affect device performance and reliability. Devices should be handled in accordance with strict ESD procedures for Class 0 <250V per JESD22 Human Body Model test, or Class A <200V JESD22 Machine Model test devices. Devices are shipped in static-safe containers and should only be handled at static-safe workstations.

See Application Note:
.
* Image Sensor Handling Best Practices** for proper handling and grounding procedures. This application note also contains workplace recommendations.

KAI-08051-ABA-JD-BA PDF数据文档
图片 型号 厂商 下载
KAI-08051-ABA-JD-BA ON Semiconductor 安森美
KAI-0340-ABB-CP-AA-SINGLE ON Semiconductor 安森美
KAI-02150-ABA-JP-BA ON Semiconductor 安森美
KAI-04070-QBA-JD-BA ON Semiconductor 安森美
KAI-02150-FBA-FD-BA ON Semiconductor 安森美
KAI-02150-ABA-FD-BA ON Semiconductor 安森美
KAI-0340-ABB-CB-AA-SINGLE ON Semiconductor 安森美
KAI-0373-AAA-CP-BA ON Semiconductor 安森美
KAI-08050-AAA-JP-BA ON Semiconductor 安森美
KAI-02170-ABA-JD-BA ON Semiconductor 安森美
KAI-11002-AAA-CR-B2 ON Semiconductor 安森美