F77205B200G300

FEINMETALL F77205B200G300 弹簧探针

The is a spring contact Standard Probe with gold-plated beryllium copper contacts, suitable for in-circuit and functional test ICT/FCT. This F772 series probe is used in dual-stage fixtures together with the F797 and it permits a variable projection height. It is used for used for a fixed projection height of 10mm and is identical to the threaded probe F732.