SN74BCT8240ANT

八进制反相缓冲器扫描测试设备 SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

description

The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPEtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.

Members of the Texas Instruments SCOPE Family of Testability Products

Octal Test-Integrated Circuits

Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode

Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Test Operation Synchronous to Test Access Port TAP

Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin

SCOPE Instruction Set

  – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

  – Parallel-Signature Analysis at Inputs

  – Pseudo-Random Pattern Generation From Outputs

  – Sample Inputs/Toggle Outputs

Package Options Include Plastic Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic and Ceramic 300-mil DIPs JT, NT