SN74BCT8374ADW

与八D型边沿触发触发器扫描测试设备 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description

The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPEtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.

Members of the Texas Instruments SCOPEFamily of Testability Products

Octal Test-Integrated Circuits

Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode

Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

Test Operation Synchronous to Test Access Port TAP

Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage 10 V on TMS Pin

SCOPEInstruction Set

  − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

  − Parallel-Signature Analysis at Inputs

  − Pseudo-Random Pattern Generation From Outputs

  − Sample Inputs/Toggle Outputs

Package Options Include Plastic Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic NT and Ceramic JT 300-mil DIPs