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S-2-H-10-G

S-2-H-10-G

数据手册.pdf
IDIInterconnect Devices 电子元器件分类

Spring Contact Probe

Size 2, 0.100 Centerline, Spring Contact, Test Probe Use Spring Probes to maximize your testing efficiency, Short Stroke Probes are ideal for bare Board testing of conventional or SMT PCBs.

* Tip Style: Serrated

* Maximum Travel: 0.160 4.06 In.mm

* Spring Force: 10.0 Oz. @ 0.100 2.54 In.mm


Allied Electronics:
SPRING CONTACT PROBE


S-2-H-10-G中文资料参数规格
技术参数

额定电流 3.00 A

其他

Brand/Series S-2 Series

Centerline, Spacing 0.100 2.54 In.mm In.mm

Contact Resistance 35 Milliohms Max. Milliohms Max.

Current Rating 3 A A

Force, Spring 10.0 Oz. Oz.

Gender Probe

Length, Overall 0.970 In. In.

Material, Barrel Nickel/Silver

Material, Plating Gold Plated Plunger

Material, Plunger Beryllium Copper

Material, Spring Beryllium Copper

Maximum Travel 0.160 In.

Minimum Centers 0.100 In.

Primary Type Probe

Size Size 2

Tip Style H - Serrated 9Pt.

Type Connector Probe

符合标准

RoHS标准 RoHS Compliant

S-2-H-10-G引脚图与封装图
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