SN74BCT8373ADW

八进制D类锁存器扫描测试设备 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

description

The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port TAP interface.

Members of the Texas Instruments SCOPEFamily of Testability Products

Octal Test-Integrated Circuits

Functionally Equivalent to ’F373 and ’BCT373 in the Normal-Function Mode

Compatible With the IEEE Standard  1149.1-1990 JTAG Test Access Port and  Boundary-Scan Architecture

Test Operation Synchronous to Test Access Port TAP

Implement Optional Test Reset Signal by  Recognizing a Double-High-Level Voltage  10 V on TMS Pin

SCOPEInstruction Set

  – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

  – Parallel Signature Analysis at Inputs

  – Pseudo-Random Pattern Generation From Outputs

  – Sample Inputs/Toggle Outputs

Package Options Include Plastic Small-Outline DW Packages, Ceramic Chip Carriers FK, and Standard Plastic and Ceramic 300-mil DIPs JT, NT